29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


Keynote Speeches

   
  Paolo Gargini - Chairman of International Roadmap for Devices and Systems (IRDS)
How to successfully overcome inflection points, or long live Moore's law
Details
   
   Philip Carne Kjær - Vestas Wind Systems A/S
Vestas' practice in reliability engineering for power electronics
Details
   

Invited Speeches

   
  Mehdi B. Tahoori - Karlsruhe Institute of Technology
Cross-Layer Approaches for Resilient VLSI System Design
Details
   
  Barry Linder - IBM Systems Group, Yorktown Heights, NY
The end of gate oxide scaling (for real this time)
Details
   
  Paul Pfaeffli - Synopsys Switzerland LLC
TCAD Modelling for Reliability
Details
   
  Frank Altmann - Fraunhofer IMWS, Center for Applied Microstructure Diagnostics CAM
Analytics for physics of failure in automotive applications
Details
   
  Nino Stojadinovic - University of Nis, Serbia
NBTI and Radiation Related Degradation and Lifetime Estimation in Power VDMOSFETs
Details
   
  Josef Lutz - Technische Universität Chemnitz, Germany
Reliability and reliability investigation of WBG power devices
Details
   
  Rajan Ambat - Technical University of Denmark
Interplay of humidity and electrical functionality imposing reliability problems in electronics
Details
   
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