|PVA TePla Analytical Systems designs and manufactures state of the art Scanning Acoustic Microscopes. The company is owned by PVA TePla AG, a leading supplier of crystal growing systems for the semiconductor industry and photovoltaic applications. Technological developments have focused on the detection of structural defects and materials characterization within opaque materials. Scanning Acoustic Microscope (SAM) utilizes ultrasound to non-destructively examine surfaces and internal structures of a solid sample. Voids, inculsions, cracks and even density variations are alle defects sensitive tot he technique of acoustic microscopy. During the last 10 years our company introduced fully automated inline inspection SAMs for Si quality control, bonding inspection of MEMS, wafers and 3D integration products. PVA TePla operates an international sales and service network with own application laboratories in the US, Japan, Singapore and Malaysia. We cooperate with a large number of university facilities. Analytical Systems GmbH participates in a large number of funding projects and takes an active part in research and development in respect of ultrasound methodology and transducer development.|
Our company is well known for its qualified personnel, high quality, short reaction times, customized solutions and years of experience. Our application engineers offer the most qualified know-how resource of SAM.
Our product range covers measurement and testing systems with ultrasound. In this case, our customers can choose from a large number of Scanning Acoustic Microscope as laboratory, semi-automated and fully automated systems. All systems can be customized to customers specific needs and requirements. Furthermore, all Scanning Acoustic Microscopes offer user-friendly application and structured user interface. Our measuring systems are equipped with transducers developed and manufactured in-house. Transducers from 3 to 2000 MHz are available for our systems. Specially adapted software, adjusted to our systems, offers the possibility to analyse samples in minute detail. In opposition to our competitors we distinguish ourselves from the competition by our long time experience in acoustic GHz-Microscopy which enables resolution below the 1 μm. The inclusion of multi-channel-scans permits a high troughput of samples and a shorter scantime. Our systems reduce your operating costs and become an important element in quality control of industry and semi-conductor business. The applications of SAM range from non-destructive examination of components in industry to analysis of medical and biological properties in opaque materials. Let yourself be convinced by our expertise and skills in Scanning Acoustic Microscopy.