29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


Technical Program Committee

Technical Program Chairs

  • M. CIAPPA - ETH Zurich, Switzerland
  • P. COVA - University of Parma, Italy
  • G. MENEGHESSO - University of Padua, Italy

Tracks in ESREF 2018

A - Quality and Reliability assessment techniques and methods for Devices and Systems

  • Ninoslav STOJADINOVIC - University of Nis, Serbia
  • Cora SALM - UTwente, Netherland

B1 - Si-Technologies & Nanoelectronics: Hot carriers, high K, gate materials

  • Gabriella GHIDINI - STMicroeectronics, Italy
  • Alain BRAVAIX - ISEN-Toulon, France

B2 - Si Technologies & Nanoelectronics: Low K, Cu Interconnects

  • Eckhard LANGER - Globalfoundries, Germany
  • Hervé JAOUEN - STMicroelectronics, France

B3 - Si-Technologies & Nanoelectronics: ESD, EMI and Latch-up

  • Gianluca BOSELLI - TI, USA
  • Marise BAFLEUR - LAAS, France

C - Progress in Failure Analysis: Defect Detection and Analysis

  • Giovanna MURA - University of Cagliari, Italy
  • Vladimir POPOK - Aalborg University, Denmark

D - Reliability of Microwave and compound semiconductors devices

  • Nathalie LABAT - IMS Bordeaux, France
  • Michael DAMMANN - Fraunhofer IAF, Germany

E1 - Power Devices Reliability - Silicon and Passive

  • Reinhold BAYERER - Infineon, Germany
  • Huai WANG - Aalborg University, Denmark

E2 - Power Devices Reliability - Wide Bandgap Devices

  • Matteo MENEGHINI - University of Padova, Italy
  • Joachim WUERFL - FBH Germany

F - Packaging and Assembly Reliability

  • Kristine WEIDE-ZAAGE - Hannover University, Germany
  • Rene RONGEN - NXP, Netherlands

G - MEMS, SENSORS and ORGANIC ELECTRONICS Reliability

  • Fabio COCCETTI - FIALAB, France
  • Stefan OBERHOFF - BOSCH, Germany

H - Photonics Reliability

  • Massimo VANZI - University of Cagliari, Italy
  • Alain BENSOUSSAN - IRT Saint Exupéry, France

I - Extreme environments and Radiation

  • Simone GERARDIN - Università di Padova, Italy
  • Olivier CREPEL - Airbus, France

K - Renewable Energies reliability

  • Salvo LOMBARDO - IMM CNR, Italy
  • Yongheng YANG - Alborg University, Denmark

L - Modeling for reliability

  • Luca SPONTON - Synopsys, Switzerland
  • Susanna REGGIANI - University of Bologna, Italy

SS1 - Reliability in traction applications (Special Session)

  • Zoubir KHATIR - IFSTTAR, France
  • Hong LI - Beijing Jiaotong University, China
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