29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


Steering Committee

M. BAFLEUR - LAAS-CNRS (F)
A. BENSOUSSAN - TAS / IRT (F)
C. BOIT TUB - Tech. University of Berlin (D)
G. BUSATTO - University of Cassino (I)
M. CIAPPA - ETH Z├╝rich (CH)
Y. DANTO - IMS, University of Bordeaux (F)
I. De WOLF - IMEC (B)
G. ERIKSEN - GRUNDFOS (DK)
F. FANTINI - University of Modena (I)
B. FOUCHER - AIRBUS GROUP INNOVATION (F)
Ph. GALY - ST Microelectronics (France)
W. GERLING - ECPE (D)
S. GOERLICH - Infineon (D)
R. HEIDERHOFF - University of Wuppertal (D)
N. LABAT - IMS, University of Bordeaux (F)
J.R. LLOYD - University of Albany (USA)
F. MARC - IMS, University of Bordeaux (F)
G. MENEGHESSO - University of Padova (I)
E. MIRANDA - University Autonoma Barcelona (E)
J.L. MURARO - THALES Alenia Space (F)
J. BISSCHOP - NXP Semiconductors (NL)
G. PAPAIOANNOU - University of Athens (G)
Ph. PERDU - CNES (F)
M. PETZOLD - Fraunhofer IMWS-CAM (D)
C. SALM - University of Twente (NL)
N. STOJADINOVIC - University of Nis (S)
A. TOUBOUL - IMS, University of Bordeaux (F)
M. VANZI - University of Cagliari (I)
E. WOLFGANG - ECPE (D)
W. WONDRAK - Daimler Chrysler (D)

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