29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


Tutorial Lectures

Monday, October 1, 2018

Chairman: Tomislav Dragicevic

   
  Gabriella Ghidini - STMicroelectronics SRL
Dielectric Reliability in Microelectronics: a tight relationship between degradation and technology
Details
   
 
 Andreas Middendorf, Olaf Wittler - Fraunhofer IZM
Reliability of packages for power devices
Details
   
  Matthias Lassmann - Infineon
Moisture Modeling in Complex Systems
Details
   
  Peter de Place Rimmen - Danfoss Drives A/S
Introduction to the modern Reliability based on physics and statistics
Details
   
 
 Thomas Detzel, Thomas Aichinger - Infineon
Reliability of SiC and GaN power devices from the industrial perspective
Details
   
   Alberto Mancaleoni - ST Automotive
Interplay of humidity and electrical functionality imposing reliability problems in electronics
Details
   
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