29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
AALBORG, DENMARK - OCTOBER 1-5, 2018


“I really enjoyed ESREF in Aalborg and was very pleased with all the arrangements and the overall logistical organization of the conference at this beautiful location. I should say it was a roaring success with a record number of submissions, exhibitors and a beautifully planned out program with adequate opportunities for technical interactions and social networking. I hope to attend ESREF more consistently in the years to come and look forward to more learning experiences there with different cultural connections to different parts of Europe!”

Nagarajan Raghavan (IPFA Co-Chair, SUTD, Singapore)



“I had a great time at ESREF 2018. I learned a lot from the technical talks especially on the GaN reliability. I got chance to network with many other researchers/engineers from academia and industries. The social event at Voergaard Castle was also very well organized, served with a great food and very entertaining shows. Overall, I can say ESREF 2018 was a great success. Congratulations to all the organizers! Looking forward to attend ESREF 2019”

Wardhana A. Sasangka (IPFA 2019 Technical Program Co-Chair/SMART, Singapore)



“It was excellent, from the content and from the organisation”

“Even if I think very hard I cannot come with any idea what could be improved at all”

“The catering was perfect”

Andreja Rojko, ECPE



“I really enjoyed taking part”

Stefan Oberhoff, Bosch

“Thank you for organizing the conference, I really enjoyed it very much!”

Daniel Beckmeier, Infineon



“Really, ESREF2018 was a great conference!”

Paolo Cova

“Indeed, it was a very interesting, and also very well organized, conference”

Paolo Mangone



“Very well organized ESREF conference”

Søren Jørgensen, Grundfos

“Thanks for organising the ESREF conference. It was a good one”

Jose Ortiz Gonzalez



“Thank you for this great conference. I enjoyed it a lot”

Shahriyar Kaboli

“You did a great job”

Giovanna Mura



“First keynote speaker is superb”

“Great presentations, good topics”

“The organisation was great”

Anonymous conference participants (on the 1st conference day)



“Highly interesting keynote from ITRS”

“The location has enough room for all the visitors”

“My favourite is the app”

Anonymous conference participants (on the 1st conference day)



“The food was good”

“Very interesting first day”

“Good overview of several subjects during tutorials”

Anonymous conference participants (on the 1st conference day)



“A nice event”

“Great opportunity to meet people from other countries and fields”

“It is very positive”

Anonymous conference participants (on the Young Professional Reception)



“Thanks to all the organization”

“Nice opportunity to network”

“I liked the setting”

Anonymous conference participants (on the Young Professional Reception)



“Very good”

“I have collected only positive experiences”

“Excellent”

Anonymous conference participants (on the 3rd conference day)



“It was my best dinner”

“Really it was a pleasure”

“The bus travel was greatly organised”

Anonymous conference participants (on the Gala Dinner)



“Interesting small stories around the castle”

“The location was wonderful”

“The idea with the historical touch was very entertaining”

Anonymous conference participants (on the Gala Dinner)



“Amazing!”

“Super fun!”

“Very nice!”

Anonymous conference participants (on the Gala Dinner)



“I really enjoyed the drinks, food and the best was maybe the organiser and the artists”

“A very nice, unique and original event – well done”

Anonymous conference participants (on the Gala Dinner)





INVITED SPEECH
Mehdi B. Tahoori - Karlsruhe Institute of Technology
Cross-Layer Approaches for Resilient VLSI System Design
Abstract
As the minimum feature size continues to shrink, a host of vulnerabilities influence the resiliency of VLSI circuits, such as increased process variation as well as workload-dependent runtime variations due to voltage and thermal fluctuations together with various device and interconnect aging effects. Current approaches for variation-aware resilient circuit design consider only a small subset of these factors and typically address each of them in isolation. As a result, an over-pessimistic additive design margin, resulting from these sources, is eroding gains from technology scaling. In this talk I will discuss cross-layer approaches for holistic modeling of various variation effects in the design stack, by taking into account netlist, layout and workload to capture all spatial and temporal information, and also consider the interplay of various process and runtime variation effects. In addition, I will cover cross-layer variation-aware design optimization schemes.
Biography
Mehdi Tahoori is currently a Full Professor and the Chair of Dependable Nano-Computing, Institute of Computer Science and Engineering, Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany. He received the B.S. degree in computer engineering from the Sharif University of Technology, Tehran, Iran, in 2000, and the M.S. and Ph.D. degrees in electrical engineering from Stanford University, Stanford, CA, in 2002 and 2003, respectively. In 2003, he was an Assistant Professor with the Department of Electrical and Computer Engineering, Northeastern University, where he became an Associate Professor in 2009. From August to December 2015, he was a visiting professor at VLSI Design and Education Center (VDEC), University of Tokyo, Japan. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology, and holds several US and European patents. He is currently the editor-in-chief of Microelectronic Reliability journal, associate editor for IEEE Design and Test Magazine, coordinating editor for Springer Journal of Electronic Testing (JETTA), and associate editor of IET Computers and Digital Techniques. He is the program chair of VLSI Test Symposium 2018 and General Chair of European Test Symposium 2019. Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award. He has received a number of best paper nominations and awards at various conferences and journals.
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